History

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2019
  • Received the Prime Minister Award in the 12th Semiconductor day
  • Renewed the certificates of ISO 14001:2015, 9001:2015 and OHSAS 18001:2007
  • Received the Korean World-Class Product Award 2019
2018
  • Introduced the 4th generation of overlay metrology system (model : OL-800n)
  • Received the certificates of CE by TUV Rheinland (OL-100n)
  • Renewed the certificates of ISO 9001:2015 and ISO 14001:2015
2017
  • Introduced the first commercial overlay metrology system for 150/200mm wafer (model : OL-100n)
  • Recognized with Innovative Firm of Technology by SK Hynix
  • Acquired SEMI membership
2016
  • Received the certificates of S-Mark by Korea Occupational Safety and Health Agency (OL-700n)
  • Received the certificates of ISO9001/14001 and OHSAS18001
  • Opened Customer Training Center
  • Moved into a new facility on dongtansandan-6 gil in Hwaseong-si, Korea (HQ & factory)
2015
  • Received the certificates of CE by TUV Rheinland (OL-700n)
  • Introduced the 3rd generation of overlay metrology system (model: OL-700n)
  • Conducted the Government R&D Program named with Stress Metrology System (2015~2016)
2014
  • Recognized with IP Star Company by Gyeonggi Techno-Park
  • Opened CS office in Icheon, Korea
  • Honored with Excellence in Employee Invention Promotion by the Korean Intellectual Property Office
  • Opened Japan sales office in Tokyo, Japan
  • Detached iMT Corp from AUROS Technology
2013
  • Received the certificates of CE by TUV Rheinland (OL-600n)
  • Recognized with A Venture Enterprise by Korea Technology Finance Corporation
  • Recognized with a Promising Export Firm by Small and Medium Business Administration of Korea
  • Introduced the first commercial pellicle/mask inspection system (model: PIS-250)
  • Awarded the IR52 Jang Young-Shil Award 2013 by the Ministry of Science, ICT & Future Planning, Korea
  • Released the 2nd generation of overlay metrology system (model: OL-600n)
  • Served as sales representative of Neocera (defect inspection system)
2012
  • Opened CS office in Wuxi, China
  • Delivered the first overlay metrology system in China
  • Introduced the first LED PSS inspection system (model: API-2500)
  • Served as sales representative of N&K (film thickness & OCD measurement system)
  • Received the Korean World-Class Product Award 2012
  • Acquired iMT Corp, a solution provider of cleaning systems in semiconductor and FPD
  • Received the Ministry of Knowledge Economy Award in 42nd Korea Precision Technology Contest
  • Received the Ministry of Knowledge Economy Award in 5th Semiconductor Day
  • Moved into a new building on Samsung 1-ro 5-gil in Hwaseong-si, Korea (HQ & factory)
  • Conducted Industrial Core Technology Development Program (patterned wafer inspection system)
  • Received the Certificate of Performance Test for Mass Production from IDM Semiconductor customers
  • Implemented the 6th Semiconductor Material and Equipment Performance Assessment Project
2011
  • Received the certificates of CE by TUV Rheinland (OL-300n)
  • Conducted 2011 New Growth R&D Program (E-Beam overlay)
  • Acquired LED PSS inspection business from ERI Co., Ltd.
  • Honored as a member of Project for Strengthening the Competitiveness of New Growth Engine by the Ministry of Knowledge Economy of Korea
  • Opened R&D Center in Israel
  • Conducted 2011 Qualification Program for Semiconductor Equipment with SEC & SK Hynix (optical overlay metrology system)
  • Introduced the first commercial overlay metrology system (model: OL-300n)
  • Implemented the 5th Semiconductor Material and Equipment Performance Assessment Project
2010
  • Changed company name to AUROS Technology, Inc.
  • Served as Sales Representative of semiconductor equipment & materials companies
2009
  • Started to develop wafer inspection system
  • Started to develop overlay metrology system
  • Opened AUROS R&D Center
  • Established AUROS Co., Ltd.
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